Electron Backscatter Diffraction analysis systems for materials characterisation
The X-Supreme 8000 Benchtop XRF for rapid results with little or no sample preparation
Manipulate and fabricate on a nano-scale using Oxford Instruments Omniprobe tools
The ultimate analysis platform for SEM, TEM and FIB
Next generation silicon drift detectors for energy dispersive analysis in SEM, TEM and FIB
Fast, flexible, accurate coating thickness and materials analysis
The LabX3500 for production environments – robust, reliable and easy to use
The innovative EDS system specifically optimised for advanced TEM applications
3D Surface measurement software for the scanning electron microscope (SEM)

Nanotechnology Tools for Electron Microscopy

Characterisation tools for SEM, TEM and FIBSEM including EDS, WDS, EBSD, plus accessories for nanomanipulation and nanofabrication

X-Ray Fluorescence (XRF) Analysers

Comprehensive range of portable, handheld, benchtop and laboratory XRF analysers

Coating Thickness Measurement

Ranging from eddy / mag gauges for ultimate portability to laboratory analysers using the latest SDD detector technology

Service & Support

We are committed to providing our customers with comprehensive service and support for every product we offer