Analytical Solutions for SEM and TEM

 

 Energy Dispersive X-Ray Analysis (EDS) for SEM & TEM

 Wavelength Dispersive X-Ray Analysis (WDS) for SEM

 HKL Electron Backscattered Diffraction Systems (EBSD)

 


Oxford Instruments Nanoanalysis – Energy Dispersive X-Ray Analysis (EDS) for SEM & TEM


  

Oxford Instruments offers X-MAX, the world’s largest area analytical Silicon Drift Detector (SDD) for EDS analysis in both Scanning and Transmission Electron Microscopes

X-Max offers sensors up to 80mm2 & solid angles 10 times larger than standard SDDs.

  • 10 times bigger means ten times more productive
  • 10 times larger means increased accuracy with no loss in resolution.

X-Max – Because Size Matters

                                                                  Click here for a brief video demonstration

The world renowned Oxford Instruments INCA platform offers users the most comprehensive range of analytical capabilities including:

  • Qualitative and quantitative elemental compositional analysis
  • Elemental distribution and phase analysis
  • Non-destructive Thin Film Thickness and Compositional measurement
  • Industry specific particle analysis and classification

 
 

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Oxford Instruments Nanoanalysis – Wavelength Dispersive X-Ray Analysis (WDS) for SEM

 

The Oxford Instruments INCA Wave delivers the power of WDX sensitivity and resolution with the enhanced productivity of the INCA platform.

INCA Wave’s superior peak separation and trace element detection using WDS results in:   

  • The best results in microanalysis
  • Excellent resolution <10eV for resolving important overlaps like S/Mo 
  • Ultimate sensitivity for trace elements (around 0.01wt.%)
  • Optimised detection for both low and high energy x-rays
  • Full goniometer movement with complete and continuous spectral coverage

   Guaranteed performance specification for every spectrometer

Achieve the accuracy of an EPMA on an SEM

Use INCA Wave for accurate quantitative analysis below 500ppm.

The graph shown left shows how INCAWave WDS closely mirrors EPMA accuracy when analysing 32 different mineral grains containing low concentrations of sodium


 INCA Energy+ Combined EDS / WDS for Speed and Accuracy

Get the best of both worlds for qualitative, quantitative analysis and unambiguous x-ray mapping

 

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Oxford Instruments HKL Electron Backscattered Diffraction Systems (EBSD)

 

Microstructural EBSD measurements of phase and orientation rely on detecting and analysing electron backscatter (Kikuchi) patterns (EBSP) generated in the Scanning Electron Microscope (SEM) from a polycrystalline sample.

Oxford Instruments HKL offer a range of systems to suit every application:

Nordlys S – the highest resolution detector available on the market

Nordlys F+ - achieving acquisition and indexing speeds >600Hz and fitted with an IR filter for dynamic heating studies

Channel5 – extensive data acquisition and post processing software

EBSD in 3 Dimensions – FIB integration for 3 dimensional EBSD analysis

INCA Synergy – Combined EDS and EBSD Analysis

Contact us for more technical details or an application note

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