Enabling results for science and industry

QLD: (07) 4059 0784
VIC: (03) 9681 9192

3D Surface measurement
software for the scanning
electron microscope (SEM)

Electron Backscatter
Diffraction analysis systems
for materials characterisation

The LabX3500 for
production environments —
robust, reliable and easy
to use

The X-Supreme 8000
Benchtop XRF for rapid
results with little or
no sample preparation

The ultimate analysis
platform for SEM,
TEM and FIB

The innovative EDS
system specifically optimised
for advanced TEM
applications

Manipulate and fabricate
on a nano-scale using
Oxford Instruments
Omniprobe tools

Next generation silicon
drift detectors for
energy dispersive
analysis in SEM,
TEM and FIB

NANOTECHNOLOGY TOOLS FOR ELECTRON MICROSCOPY

Characterisation tools for SEM, TEM and FIBSEM including EDS, WDS, EBSD, plus accessories for nanomanipulation and nanofabrication



X-RAY FLUORESCENCE (XRF) ANALYSERS

Comprehensive range of portable, handheld, benchtop and laboratory XRF analysers




COATING THICKNESS MEASUREMENT

Ranging from eddy / mag gauges for ultimate portability to laboratory analysers using the latest SDD detector technology




SERVICE & SUPPORT

We are committed to providing our customers with comprehensive service and support for every product we offer